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Valence and conduction band offsets of a ZrO2/SiOxNy/n-Si...

Valence and conduction band offsets of a ZrO2/SiOxNy/n-Si CMOS gate stack: a combined photoemission and inverse phtotemission study.

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S. Sayan, R. A. Bartynski, X. Zhao, E. P. Gusev, D. Vanderbilt, M. Croft, M. Banaszak Holl, E. Garfunkel.
Physica Status Solidi B
2004,
241,
2246-2252.
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